About this role
ARCNL Research Field Physics » Condensed matter properties Physics » Optics Researcher Profile Recognised Researcher (R2) Application Deadline 7 Feb 2027 - 11:54 (UTC) Country Netherlands Type of Contract Temporary Job Status Not Applicable Hours Per Week 40.0 Is the job funded through the EU Research Framework Programme? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure? No Offer Description Work Activities Doped semiconductor materials play a key role in electronic devices and integrated circuits. The continuous miniaturization of the active components on chips have further increased the necessity of highly controlled material quality. For high quality devices consistent quality control is required, which must be very sensitive, high-resolution, very fast and non-destructive. While the current standard for inspection is electron microscopy, optical techniques have the potential to greatly improve the detection speed while vastly reducing damaging capabilities. But to reap these benefits development is required to overcome limitations of resolution and sensitivity. While doping and defects might greatly impact the electronic properties of a materials these changes are often not reflected in their optical properties. This results in little to no contrast in conventional optical microscopes, limiting the possibility for all-optical inspection. By going beyond conventional microscopy to non-linear techniques where new wavelengths are generated within the sample, this limitation can be overcome. Here we will employ high-harmonic generation for this purpose. The harmonic process is greatly impacted by the electronic properties of the material making it highly suitable for the detection of material doping and defects. While great sensitivity to doping and defects is to be expected, how these will exactly affect the high-harmonic process is an open question. In thi...